vAging
Aging Visibility for Long-Term Clock Reliability
vAging delivers SPICE-accurate analysis of how clock paths degrade over time and how these changes affect long-term timing integrity.
It models BTI and HCI degradation under real activity patterns and reveals aging-induced delay growth, asymmetric degradation, duty-cycle distortion, and loss of edge quality that existing methodologies cannot accurately predict.
vAging uses a Fresh, Stress, Aging simulation flow at transistor-level fidelity to track degradation across the full clock domain, including multi-million gate meshes, trees, and hybrids.
With vHelm, designers can explore what-if scenarios and apply Virtual ECO adjustments to test parking strategies, stress conditions, and design fixes with immediate waveform accuracy.
Teams gain long-term visibility into how their clocks will behave in the field and can protect performance, reliability, and margin throughout the product lifetime.
Aging Effects That Threaten Clock Stability
At advanced nodes, aging has become one of the most underestimated risks to clock integrity and product performance. Aging-driven clock failures are not just silicon issues. In high-volume markets they can trigger product recalls, customer dissatisfaction, and long-term damage to business credibility. Accurate aging prediction protects not only the design, but the company behind it.
BTI and HCI shift device thresholds over time, slowing clock paths and degrading edge quality in ways that compound across billions of cycles. These effects intensify under real workloads where clock-gating patterns, voltage variation, and temperature gradients create uneven, asymmetric aging that static margins and simplified stress assumptions cannot capture. When these interactions go unseen, entire classes of failures escape detection until silicon is already in the field.
vAging exposes these degradation mechanisms directly and shows how delay, duty cycle, and slew evolve under real operating conditions. Designers can pinpoint aging hot spots early, validate mitigation strategies, and prevent long-term failures well before sign-off.

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Demo Request - 2026-Sep-16
Core Capabilities

BTI and HCI Degradation Modeling
Accurately model NBTI, PBTI, and HCI effects under real voltage, temperature, activity, and clock-gating conditions.

Full-Domain SPICE Flow
Run SPICE-level degradation and propagation analysis on multi-million gate clock domains for complete visibility of aging under real and stress conditions.

Aging-Induced Delay and Duty-Cycle Prediction
Reveal insertion delay growth, duty-cycle distortion, and edge degradation that build up over years of operation.

Asymmetric Aging Detection
Identify clock branches that age differently due to Vth degradation driven by workload variations, gating strategies, and signal conditions.

Interactive What-If and Virtual ECO
Evaluate parking strategies, stress frequencies, sizing, and topology changes with immediate waveform accuracy.

Long-Term Reliability Insight
Predict where clock paths will fall off aging cliffs and validate design fixes before tapeout.
Proven Results in Silicon
vAging uncovers degradation effects that static assumptions and conventional methodologies fail to detect. It exposes where BTI and HCI convergence will erode timing, distort duty cycle, or degrade edge quality, and validates mitigations early in the design cycle.
The result is silicon that maintains performance and reliability over years of operation, reduced guardbanding, and a design flow grounded in measured aging behavior rather than assumptions.
If aging is part of your risk profile, there is no substitute for true waveform visibility.
When Clock Matters,
ClockEdge Delivers.
